AFM-NSS

NSS GOES TO PITTCON CONFERENCE & EXPO 2018

Mon, 03 Aug 2020 12:01:55 +0000

On February 26 – March 1, 2018 NanoScience Solutions will participate as an exhibitor in the Pittcon

Conference & Expo 2018. The conference will be held at the Orange County Convention Center, Orlando, FL.
NSS will introduce there two of its unique AFM add-ons: Ringing Mode^TM and FT-nanoDMA^TM.
To schedule a meeting, please contact us.

For more information about the event click here.

NSS GOES TO THE 2017 MRS FALL MEETING AND EXHIBIT

Mon, 03 Aug 2020 12:00:44 +0000

NanoScience Solutions will be presenting at the 2017 MRS (Materials Research Society) Fall Meeting held at the Hynes Convention Center adjacent to the Sheraton Boston Hotel, Boston, Massachusetts.

There NSS will introduce two of its unique AFM add-ons: Ringing Mode^TM and FT-nanoDMA^TM.
Please come see us at booth 620 and talk with the NSS team regarding your measurement requirements.
To schedule an appointment, contact us.

For more information about the event click here.

NSS PARTICIPATED IN THE NATIONAL INNOVATIONS SUMMIT AND SHOWCASE 2017

Mon, 03 Aug 2020 11:59:01 +0000

On May 14-17, 2017 NanoScience Solutions participated in the National Innovations Summit and Showcase held at the Gaylord Convention Center, National Harbor, Maryland. There NSS introduced two atomic force microscopy (AFM) add-ons that revolutionize the AFM field. The first is “Ringing” Mode which permits AFMs to map new physical properties faster with less artifacts. The second is NSS’ FT-nanoDMA^TM imaging, a new generation AFM add-on that allows real time measurement validation with 100x higher spatial resolution and 100x greater speed than existing nanoindenters. Additionally, FT-nanoDMA^TM imaging identifies linearity of strain-stress relations at the nano scale.

Pictured above are members of NSS’ team at the National Innovation Summit and Showcase 2017.