[vc_row][vc_column][vc_empty_space][/vc_column][/vc_row][vc_row full_width=”stretch_row_content” gap=”10″ equal_height=”yes”][vc_column][vc_custom_heading text=”NSS PARTICIPATED IN THE NATIONAL INNOVATIONS SUMMIT AND SHOWCASE 2017″ font_container=”tag:h2|text_align:center|color:%23000000″ use_theme_fonts=”yes” css=”.vc_custom_1604494025161{padding-right: 5% !important;padding-left: 5% !important;}”][vc_single_image image=”538″ img_size=”medium” alignment=”center” onclick=”img_link_large”][vc_column_text css=”.vc_custom_1604389145176{padding-right: 5% !important;padding-left: 5% !important;}”]On May 14-17, 2017 NanoScience Solutions participated in the National Innovations Summit and Showcase held at the Gaylord Convention Center, National Harbor, Maryland. There NSS introduced two atomic force microscopy (AFM) add-ons that revolutionize the AFM field. The first is “Ringing” Mode which permits AFMs to map new physical properties faster with less artifacts. The second is NSS’ FT-nanoDMA^TM imaging, a new generation AFM add-on that allows real time measurement validation with 100x higher spatial resolution and 100x greater speed than existing nanoindenters. Additionally, FT-nanoDMA^TM imaging identifies linearity of strain-stress relations at the nano scale.

Pictured above are members of NSS’ team at the National Innovation Summit and Showcase 2017.[/vc_column_text][/vc_column][/vc_row][vc_row][vc_column][vc_separator border_width=”2″ el_width=”80″][/vc_column][/vc_row][vc_row][vc_column width=”1/2″][vc_column_text]

NSS GOES TO PITTCON CONFERENCE & EXPO 2018

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NSS GOES TO THE 2017 MRS FALL MEETING AND EXHIBIT

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