On May 14-17, 2017 NanoScience Solutions participated in the National Innovations Summit and Showcase held at the Gaylord Convention Center, National Harbor, Maryland. There NSS introduced two atomic force microscopy (AFM) add-ons that revolutionize the AFM field. The first is “Ringing” Mode which permits AFMs to map new physical properties faster with less artifacts. The second is NSS’ FT-nanoDMA^TM imaging, a new generation AFM add-on that allows real time measurement validation with 100x higher spatial resolution and 100x greater speed than existing nanoindenters. Additionally, FT-nanoDMA^TM imaging identifies linearity of strain-stress relations at the nano scale.

Pictured above are members of NSS’ team at the National Innovation Summit and Showcase 2017.